1、The products were well-characterized by X-ray diffractometer and scanning electron microscope.
所得產(chǎn)物用X射線衍射儀(XRD)和掃描電子顯微鏡(SEM)進行了表征。

2、The Principle of X-ray diffractometer method of macrostress measurement is described in this Paper.
本文敘述了使用X射線衍射儀法測量宏觀應(yīng)力的原理。

3、It was characterized by optical microscope, SEM, IR, DSC and X-rays diffractometer respectively.
采用光學(xué)顯微鏡、SEM、IR、DSC和X射線衍射等多種手段對其進行表征。

diffractometer翻譯